SCR Device for System-Level ESD Protection(2012)

semico_ljj · 发表于 2012-7-25 09:31:09

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New Design of Transient-Noise Detection Circuit with SCR Device for System-Level ESD Protection

Ming-Dou Ker and Wan-Yen Lin
Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan

Abstract -- A new SCR-based transient detection circuit for onchip
protection design against system-level ESD-induced
electrical transient disturbance is proposed and verified in
silicon chip. The experimental results in a 0.18-μm CMOS
process have confirmed that the new proposed detection circuit
can successfully memorize the occurrence of system-level ESDinduced
electrical transient events. The detection output can be
cooperated with firmware operation to automatically execute
system recovery procedure, therefore the immunity of
microelectronic systems against system-level ESD test can be
effectively improved