IC latch up

mason2012 · 发表于 2012-9-11 12:38:43

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This specification covers the I-test and the overvoltage latch-up testing of integrated circuits.

The purpose of this specification is to establish a method for determining IC latch-up characteristics and to

define latch-up failure criteria. Latch-up characteristics are extremely important in determining product

reliability and minimizing No Trouble Found (NTF) and Electrical Overstress (EOS) failures due to

latch-up. This test method is applicable to NMOS, CMOS, bipolar, and all variations and combinations of

these technologies.

iyahsue · 发表于 2012-9-11 15:27:30

gooooooooooooooooooooooooooood

suows · 发表于 2012-9-11 22:25:35

谢谢楼主，收藏了，不错

allin · 发表于 2013-3-12 11:21:00

efong · 发表于 2016-6-26 13:36:05

THANK YOU

david.yih · 发表于 2016-7-26 12:50:25

good!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!

ieeitop666 · 发表于 2016-9-4 21:05:01

SO COOL

hfwxgl · 发表于 2016-9-9 18:11:08

看看啥资料！！

zijindianke · 发表于 2016-10-29 12:50:40

谢谢分享

ycz800429 · 发表于 2016-11-2 14:38:43

下载了看看......

[其它] IC latch up