Advanced Experimental Methods for Noise Research

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CONTENTS

PREFACE IX

I. Noise Sources

1/f Noise Sources 3

F.N. Hooge

Noise Sources in GaN/AlGaN Quantum Wells and Devices 11

S. Rumyantsev

1/f Noise in Nanomaterials and Nanostructures: Old Questions

in a New Fashion 19

M. N. Mihaila

1/f Spectra as a Consequence of the Randomness of Variance 29

G. Härtler

Quantum Phase Locking, 1/f Noise and Entanglement 37

M. Planat and H.Rosu

Shot Noise in Mesoscopic Devices and Quantum Dot Networks 45

M. Macucci, P. Marconcini, G. Iannaccone, M. Gattobigio,

G. Basso and B. Pellegrini

Super-Poissonian Noise in Nanostructures 53

Ya. M. Blanter

Stochastic and Deterministic Models of Noise 61

J. Kumi􀃾ák

II. Noise in Nanoscale Devices

Noise in Optoelectronic Devices 71

R. Alabedra

Fluctuations of Optical and Electrical Parameters and Their

Correlation of Multiple-Quantum-Well INGAAS/INP Lasers 79

S. Pralgauskait􀆡, V. Palenskis and J. Matukas

Microwave Noise and Fast/Ultrafast Electronic Processes

in Nitride 2DEG Channels 89

A. Matulionis

Noise of High Temperature Superconducting Bolometers 97

I.A. Khrebtov

1/f Noise in MOSTs: Faster is Noisier 109

L.K.J. Vandamme

Experimental Assessment of Quantum Effects in the Low-

Frequency Noise and RTS of Deep Submicron MOSFETs 121

E. Simoen, A. Mercha and C. Claeys

Noise and Tunneling Through the 2.5 nm Gate Oxide

in SOI MOSFETs 129

N. Lukyanchikova, E. Simoen, A. Mercha and C. Claeys

Low Frequency Noise Studies of Si Nano-Crystal Effects

in MOS Transistors and Capacitors 137

S. Ferraton, L. Montès, I. Ionica, J. Zimmermann,

and J. A. Chroboczek

Noise Modelling in Low Dimensional Electronic Structures 145

L. Reggiani, V. Ya. Aleshkin and A. Reklaitis

Correlation Noise Measurements and Modeling of Nanoscale

MOSFETs 153

J. Lee and G. Bosman

Tunneling Effects and Low Frequency Noise of GaN/GaAlN

HFETs 161

M. Levinshtein, S. Rumyantsev and M. S. Shur

High Frequency Noise Sources Extraction in Nanometique

MOSFETs 169

F. Danneville, G. Pailloncy and G. Dambrine

Informative “Passport Data” of Surface Nano- and

Microstructures 177

S. F. Timashev, A. B. Solovieva and G. V. Vstovsky

III. Noise Measurement Technique

Noise Measurement Techniques 189

L.K.J. Vandamme

Techniques for High-Sensitivity Measurements of Shot Noise

in Nanostructures 203

B.Pellegrini, G. Basso and M. Macucci

Correlation Spectrum Analyzer: Principles and Limits

in Noise Measurements 211

G. Ferrari and M. Sampietro

Measurement and Analysis Methods for Random

Telegraph Signals 219

Z. Çelik-Butler

RTS In Quantum Dots and MOSFETs: Experimental Set-Up

with Long-Time Stability and Magnetic Field Compensation 227

J. Sikula, J. Pavelka, M. Tacano, S. Hashiguchi and M. Toita

Some Considerations for the Construction of Low-Noise

Amplifiers in Very Low Frequency Region 237

J. Sikula, S. Hashiguchi, M. Ohki and M. Tacano

Measurements of Low Frequency Noise in Nano-Grained

RuO2+Glass Films Below 1 K 245

A. Kolek

Technique for Investigation of Non-Gaussian and Non-Stationary

Properties of LF Noise in Nanoscale Semiconductor Devices 253

A. Yakimov, A. Belyakov, S. Medvedev, A. Moryashin

and M. Perov

The Noise Background Suppression of Noise Measuring Set-Up 261

P. Hruska and K. Hajek

Accuracy of Noise Measurements for 1/f and GR Noise 271

I. Slaidi􀆼š

Radiofrequency and Microwave Noise Metrology 279

E. Rubiola and V. Giordano

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