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[size=120%]Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures
By Milos Stanisavljevic, Alexandre Schmid, Yusuf Leblebici
- Publisher: Springer
- Number Of Pages: 195
- Publication Date: 2010-10-21
- ISBN-10 / ASIN: 1441962166
- ISBN-13 / EAN: 9781441962164
Product Description:
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components |
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