第二课:Defect characterization for reliability assessment in advanced logic and memory devices
主讲人:纪志罡 副教授 英国利物浦约翰摩尔斯大学
课题内容:
Part 1: standard logic devices
• Defect detection and separation (BTI as example)
• Defect-based modelling methodology for reliability assessment.
• Application to devices with high channel mobility materials
Part 2: Novel ReRAM devices
• Defect in ReRAM devices
• Defect detection and extraction
• Defect tracking technique for reliability assessment in ReRAM processes.