在线咨询
eetop公众号 创芯大讲堂 创芯人才网
切换到宽版

EETOP 创芯网论坛 (原名:电子顶级开发网)

手机号码,快捷登录

手机号码,快捷登录

找回密码

  登录   注册  

快捷导航
搜帖子
查看: 1694|回复: 9

[原创] Manufacturing Test and DFT

[复制链接]
发表于 2017-10-23 22:04:42 | 显示全部楼层 |阅读模式

马上注册,结交更多好友,享用更多功能,让你轻松玩转社区。

您需要 登录 才可以下载或查看,没有账号?注册

x
EASY SCAN undersatnding

Manufacturing Test and DFT
As mentioned previously, once the circuit design has been proven and characterized, the circuit moves into volume
manufacturing. At that time emphasis shifts from design concerns to manufacturing concerns. Screening for
manufacturing defects becomes the main focus of test. Structural Vectors become important in this phase to ensure high
fault coverage and quality. These tests are sometimes called Defected-Oriented tests because they are designed to detect
specific defects. Structural vectors are often based upon a gate level circuit model, and their goal

ScanSample.pdf

682.34 KB, 下载次数: 45 , 下载积分: 资产 -2 信元, 下载支出 2 信元

发表于 2017-10-24 18:25:54 | 显示全部楼层
thanks
发表于 2017-10-24 18:29:36 | 显示全部楼层
gatelevel
发表于 2017-10-24 20:14:58 | 显示全部楼层
kankan
发表于 2017-10-28 17:39:57 | 显示全部楼层
Thanks
发表于 2017-10-29 21:45:34 | 显示全部楼层
thanks for sharing
发表于 2018-8-10 13:43:55 | 显示全部楼层
感谢分享。
发表于 2018-8-10 23:10:05 | 显示全部楼层
Thank
发表于 2020-1-13 22:26:39 | 显示全部楼层
顶一下。。。
发表于 2020-1-13 22:30:58 | 显示全部楼层
好书。。。
您需要登录后才可以回帖 登录 | 注册

本版积分规则

关闭

站长推荐 上一条 /3 下一条

×

小黑屋| 关于我们| 联系我们| 在线咨询| 隐私声明| EETOP 创芯网
( 京ICP备:10050787号 京公网安备:11010502037710 )

GMT+8, 2024-4-24 04:02 , Processed in 0.025962 second(s), 7 queries , Gzip On, Redis On.

eetop公众号 创芯大讲堂 创芯人才网
快速回复 返回顶部 返回列表