2013 spring新书：Design, Analysis and Test of Logic Circuits Under Uncertainty

lvwei_1024 · 发表于 2013-12-7 22:41:22

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Book Description[size=0.86em]Publication Date: September 21, 2012 | ISBN-10: 9048196434 | ISBN-13: 978-9048196432 | Edition: 2013
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
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