在线咨询
eetop公众号 创芯大讲堂 创芯人才网
切换到宽版

EETOP 创芯网论坛 (原名:电子顶级开发网)

手机号码,快捷登录

手机号码,快捷登录

找回密码

  登录   注册  

快捷导航
搜帖子
查看: 13144|回复: 60

[ebook]Advances in Electronic Testing: Challenges and Methodologies

[复制链接]
发表于 2009-5-4 16:53:20 | 显示全部楼层 |阅读模式

马上注册,结交更多好友,享用更多功能,让你轻松玩转社区。

您需要 登录 才可以下载或查看,没有账号?注册

x
[size=120%]Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing)
By Dimitris Gizopoulos


    Publisher:   Springer Number Of Pages:   412 Publication Date:   2006-11-30 ISBN-10 / ASIN:   0387294082
  • ISBN-13 / EAN:   9780387294087


Product Description:

Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today’s state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey.
The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, arm, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mexico Univ., Sandia National Labs, Synopsys, Teradyne and Texas Instruments.
Advances in Electronic Testing: Challenges and Methodologies is an advanced textbook and reference point for senior undergraduate and graduate students in MSc or PhD tracks, professors and research leaders in the electronic testing domain. It is also for industry design and test engineers and managers seeking a global view and understanding of test technology practices and methodologies and a dense elaboration on test-related issues they face in their development projects.
"There is a definite need for documenting the advances in testing … I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. […] the book provides, besides novel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. […] This latest addition to the Frontiers Series is destined to serve an important role." From the Foreword by Vishwani D. Agrawal, Consulting Editor, Frontiers in Electronic Testing Book Series.
cover1.jpg

ADVANCES IN ELECTRONIC TESTING.part1.rar

4.77 MB, 下载次数: 336 , 下载积分: 资产 -3 信元, 下载支出 3 信元

ADVANCES IN ELECTRONIC TESTING.part2.rar

4.77 MB, 下载次数: 314 , 下载积分: 资产 -3 信元, 下载支出 3 信元

ADVANCES IN ELECTRONIC TESTING.part3.rar

1.52 MB, 下载次数: 303 , 下载积分: 资产 -2 信元, 下载支出 2 信元

发表于 2009-5-5 23:13:17 | 显示全部楼层
thanks
发表于 2009-5-10 21:19:47 | 显示全部楼层
good ebook
发表于 2009-5-11 10:32:40 | 显示全部楼层
很好的书,谢谢分享。下来看看。
发表于 2009-5-11 13:00:00 | 显示全部楼层
不錯的資料,感謝樓主熱心分享。
发表于 2009-5-11 14:06:07 | 显示全部楼层
look the book;tks
发表于 2009-5-12 07:46:45 | 显示全部楼层
good, thanks
发表于 2009-5-13 10:40:16 | 显示全部楼层
Thanks for sharing!
发表于 2009-5-16 23:07:54 | 显示全部楼层
多谢。。。。。。。。。
发表于 2009-5-16 23:10:08 | 显示全部楼层
谢谢。。。。。。。。。。。
您需要登录后才可以回帖 登录 | 注册

本版积分规则

关闭

站长推荐 上一条 /1 下一条

×

小黑屋| 关于我们| 联系我们| 在线咨询| 隐私声明| EETOP 创芯网
( 京ICP备:10050787号 京公网安备:11010502037710 )

GMT+8, 2024-3-28 22:50 , Processed in 0.031413 second(s), 8 queries , Gzip On, Redis On.

eetop公众号 创芯大讲堂 创芯人才网
快速回复 返回顶部 返回列表